Wavelet analysis of high resolution electron microscope images

被引：0
|
作者：
Tohjimbara, T [1 ]
Endoh, H [1 ]
Kumao, A [1 ]
机构：
[1] Kyoto Inst Technol, Dept Elect & Informat Sci, Sakyo Ku, Kyoto 6060962, Japan
来源：
ELECTRON MICROSCOPY 1998, VOL 1: GENERAL INTEREST AND INSTRUMENTATION | 1998年
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：125 / 126
页数：2
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