Wavelet analysis of high resolution electron microscope images

被引：0
|
作者：
Tohjimbara, T [1 ]
Endoh, H [1 ]
Kumao, A [1 ]
机构：
[1] Kyoto Inst Technol, Dept Elect & Informat Sci, Sakyo Ku, Kyoto 6060962, Japan
来源：
ELECTRON MICROSCOPY 1998, VOL 1: GENERAL INTEREST AND INSTRUMENTATION | 1998年
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：125 / 126
页数：2
相关论文
共 50 条
  • [41] HIGH RESOLUTION GONIOMETER STAGE FOR AN ELECTRON MICROSCOPE
    MIKAZIRI, A
    OHOMORI, S
    YAMAMOTO, T
    JOURNAL OF ELECTRON MICROSCOPY, 1971, 20 (03): : 262 - &
  • [42] Simple, high resolution scanning electron microscope
    KRYGIN VM
    VERTSNER N
    CHENTSOV YUV
    1971, 38 (01): : 38 - 39
  • [43] APPROXIMATIONS FOR CALCULATION OF HIGH-RESOLUTION ELECTRON-MICROSCOPE IMAGES OF THIN-FILMS
    FEJES, PL
    ACTA CRYSTALLOGRAPHICA SECTION A, 1977, 33 (JAN1): : 109 - &
  • [44] HIGH-RESOLUTION ELECTRON MICROSCOPE IMAGES OF CRYSTAL LATTICE PLANES USING CONICAL ILLUMINATION
    HEINEMANN, K
    POPPA, H
    APPLIED PHYSICS LETTERS, 1970, 16 (12) : 515 - +
  • [45] HIGH-RESOLUTION ELECTRON-MICROSCOPE AND COMPUTED IMAGES OF HUMAN TOOTH ENAMEL CRYSTALS
    BRES, EF
    BARRY, JC
    HUTCHISON, JL
    JOURNAL OF ULTRASTRUCTURE RESEARCH, 1985, 90 (03): : 261 - 274
  • [46] 1-MV HIGH-RESOLUTION ELECTRON-MICROSCOPE IMAGES AND CHROMATIC ABERRATION
    HORIUCHI, S
    MATSUI, Y
    BANDO, Y
    SEKIKAWA, Y
    JOURNAL OF ELECTRON MICROSCOPY, 1978, 27 (04): : 356 - 356
  • [47] CALCULATION AND INTERPRETATION OF HIGH-RESOLUTION ELECTRON-MICROSCOPE IMAGES OF LATTICE-DEFECTS
    ANSTIS, GR
    COCKAYNE, DJH
    ACTA CRYSTALLOGRAPHICA SECTION A, 1979, 35 (JUL): : 511 - 524
  • [48] Minimising damage in high resolution scanning transmission electron microscope images of nanoscale structures and processes
    Nicholls, Daniel
    Lee, Juhan
    Amari, Houari
    Stevens, Andrew J.
    Mehdi, B. Layla
    Browning, Nigel D.
    NANOSCALE, 2020, 12 (41) : 21248 - 21254
  • [49] CRYSTAL SYMMETRY APPEARED IN 1 MV HIGH-RESOLUTION ELECTRON-MICROSCOPE IMAGES
    HORIUCHI, S
    MATSUI, Y
    BANDO, Y
    SEKIKAWA, Y
    JOURNAL OF ELECTRON MICROSCOPY, 1979, 28 (03): : 244 - 244
  • [50] Virtual microscope interface to high resolution histological images
    Feit, Josef
    Matyska, LudEk
    Ulman, Vladimir
    Hejtmanek, Lukas
    Jedlickova, Hana
    Jezova, Marta
    Moulis, Mojmir
    Feitova, VEra
    DIAGNOSTIC PATHOLOGY, 2008, 3 (Suppl 1)
12345