Boundary Enhanced Semantic Segmentation for High Resolution Electron Microscope Images

被引：0
|
作者：
Pollach, Matthias [1 ]
Schiegg, Felix [1 ]
Ludwig, Matthias [1 ,2 ]
Bette, Ann-Christin [1 ,2 ]
Knoll, Alois [1 ]
机构：
[1] Technical University Munich, Germany
[2] Infineon Technologies AG
来源：
European Signal Processing Conference | 2022年 / 2022-August卷
关键词：
Compendex;
D O I：
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学科分类号：
摘要：
Scanning electron microscopy
引用
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页码：523 / 527
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