An I2C Based Mixed-Signal Test and Measurement Infrastructure

被引：0

作者：

Salazar Escobar, Antonio Jose ^{[1
]}

da Silva, Jose Machado ^{[1
]}

Correia, Miguel ^{[1
]}

机构：

[1] Univ Porto, Fac Engn, INESC TEC, P-4200465 Oporto, Portugal

来源：

2014 19TH INTERNATIONAL MIXED-SIGNALS, SENSORS AND SYSTEMS TEST WORKSHOP (IMS3TW) | 2014年

关键词：

degidn for testability; embedded instruments; mixed-signal test; I2C;

D O I：

暂无

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

The framework being proposed addresses the test and measurement of circuits and systems populated with varying types of sensors and functional blocks, among which one can find embedded test instruments. Its conceptual functionality is based on four types of operations: setup, capture, process, and scan (SCPS), and aims to provide a unifying methodology for managing and synchronizing test operations and instruments. The generalized physical structure and examples of operating commands are described. An application illustrates its use in a particular case.

引用

页数：6

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