An I2C Based Mixed-Signal Test and Measurement Infrastructure

被引：0
|
作者：
Salazar Escobar, Antonio Jose [1 ]
da Silva, Jose Machado [1 ]
Correia, Miguel [1 ]
机构：
[1] Univ Porto, Fac Engn, INESC TEC, P-4200465 Oporto, Portugal
来源：
2014 19TH INTERNATIONAL MIXED-SIGNALS, SENSORS AND SYSTEMS TEST WORKSHOP (IMS3TW) | 2014年
关键词：
degidn for testability; embedded instruments; mixed-signal test; I2C;
D O I：
暂无
中图分类号：
TP301 [理论、方法];
学科分类号：
081202 ;
摘要：
The framework being proposed addresses the test and measurement of circuits and systems populated with varying types of sensors and functional blocks, among which one can find embedded test instruments. Its conceptual functionality is based on four types of operations: setup, capture, process, and scan (SCPS), and aims to provide a unifying methodology for managing and synchronizing test operations and instruments. The generalized physical structure and examples of operating commands are described. An application illustrates its use in a particular case.
引用
收藏
页数：6
相关论文
共 50 条
  • [21] Mixed-signal consortium completes test vehicles
    Electronic Design, 1995, 43 (06)
  • [22] Getting to a test standard for mixed-signal boards
    Osseiran, A
    38TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, PROCEEDINGS, VOLS 1 AND 2, 1996, : 1157 - 1161
  • [23] Convergent SOCs challenge mixed-signal test
    Vana, T
    Blair, D
    EE-EVALUATION ENGINEERING, 2003, 42 (01): : 24 - +
  • [24] Mixed-signal test training at CRTC.
    Bertrand, Y
    Azaïs, F
    Flottes, ML
    Lorival, R
    MICROELECTRONICS EDUCATION, 2000, : 251 - 254
  • [25] A study on test controller for mixed-signal circuits
    Lv, TC
    Lei, J
    Guo, XR
    ICEMI'2001: FIFTH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT AND INSTRUMENTS, VOL 1, CONFERENCE PROCEEDINGS, 2001, : 528 - 531
  • [26] Measuring mixed-signal test stimulus quality
    Sunter, Stephen
    Jurga, Krzysztof
    2018 23RD IEEE EUROPEAN TEST SYMPOSIUM (ETS), 2018,
  • [27] Parallel loopback test of mixed-signal circuits
    Park, Joonsung
    Shin, Hongjoong
    Abraham, Jacob A.
    26TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 2008, : 309 - +
  • [28] MIXED-SIGNAL SIMULATION SOFTWARE IS PUT TO THE TEST
    PELL, R
    ELECTRONIC PRODUCTS MAGAZINE, 1991, 33 (10): : 17 - 17
  • [29] CRUISING THE ROAD TO MIXED-SIGNAL MICROWAVE TEST
    DERIAN, D
    MOORE, J
    EE-EVALUATION ENGINEERING, 1995, 34 (06): : 12 - &
  • [30] Integrated Design and Test of Mixed-Signal Circuits
    Nur Engin
    Hans G. Kerkhoff
    Ronald J.W.T. Tangelder
    Han Speek
    Journal of Electronic Testing, 1999, 14 : 75 - 83
12345