High-speed high-resolution subsurface defect detection in ceramics using optical gating techniques.

被引：0
|
作者：
Bashkansky, M [1 ]
Duncan, MD [1 ]
Reintjes, J [1 ]
机构：
[1] USN, Res Lab, Washington, DC 20375 USA
来源：
REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 17A AND 17B | 1998年
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1785 / 1791
页数：7
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