Intrinsic effective piezoelectric coefficient e31,f for ferroelectric thin films -: art. no. 152901
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作者:
Ouyang, J
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Univ Maryland, Dept Mat Sci & Engn, Mat Res & Sci Engn Ctr, College Pk, MD 20742 USAUniv Maryland, Dept Mat Sci & Engn, Mat Res & Sci Engn Ctr, College Pk, MD 20742 USA
Ouyang, J
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Ramesh, R
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Univ Maryland, Dept Mat Sci & Engn, Mat Res & Sci Engn Ctr, College Pk, MD 20742 USAUniv Maryland, Dept Mat Sci & Engn, Mat Res & Sci Engn Ctr, College Pk, MD 20742 USA
Ramesh, R
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Roytburd, AL
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Univ Maryland, Dept Mat Sci & Engn, Mat Res & Sci Engn Ctr, College Pk, MD 20742 USAUniv Maryland, Dept Mat Sci & Engn, Mat Res & Sci Engn Ctr, College Pk, MD 20742 USA
Roytburd, AL
[1
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机构:
[1] Univ Maryland, Dept Mat Sci & Engn, Mat Res & Sci Engn Ctr, College Pk, MD 20742 USA
As a function of film orientation, the intrinsic effective piezoelectric coefficient e(31,f) is generally formulated for a substrate-constrained ferroelectric film. Numerical results are obtained for Pb(ZrxTi1-x)O-3 (PZT) thin films with tetragonal and rhombohedral compositions. It is illustrated that the optimal orientation for e(31,f) are close to [001] orientation in both tetragonal and rhombohedral PZT films and the maximum calculated e(31,f) is about -30 C/m(2) on the rhombohedral side of the morphotropic phase boundary. (C) 2005 American Institute of Physics.