A Simple Measurement Method of Common Source Inductance for GaN Devices

被引:0
|
作者
Wu, Jiarui [1 ]
Yang, Xu [1 ]
Wang, Kangping [1 ]
Wei, Jiwen [1 ]
Qi, Zhiyuan [1 ]
Chen, Wenjie [1 ]
Chen, Qiaoliang [2 ]
机构
[1] Xi An Jiao Tong Univ, Sch Elect Engn, Xian, Peoples R China
[2] Longteng Semicond Co Ltd, Xian, Peoples R China
基金
中国国家自然科学基金;
关键词
common source inductance; gallium nitride; double pules; measurement;
D O I
10.1109/ECCE47101.2021.9595259
中图分类号
X [环境科学、安全科学];
学科分类号
08 ; 0830 ;
摘要
Common source inductance can increase switching losses and cause false triggering. Therefore, in order to further improve the switching frequency of high frequency converters, it is important to accurately measure the value of this inductance. However, the measurement of common source inductance is constrained by some practical conditions, such as the size of the common source inductance related to the layout and the coupling between the power and drive loops. This thesis proposes a low-cost and easy measurement method that can overcome these limitations. A double pulse circuit is used to generate high frequency oscillating current signals with different frequencies and amplitudes, which flow through the common source inductance of the device under test to generate voltage signals. The common source inductance is calculated by measuring the voltage and current signals on the common source inductance. The accuracy of the measurement method is verified by measuring power devices in different packages.
引用
收藏
页码:5884 / 5888
页数:5
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