Testing mixed signal SOCs

被引：1
|
作者：
Burns, M [1 ]
机构：
[1] Texas Instruments Inc, Dallas, TX 75265 USA
来源：
INTERNATIONAL TEST CONFERENCE 1998, PROCEEDINGS | 1998年
关键词：
D O I：
10.1109/TEST.1998.743322
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：1132 / 1132
页数：1
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