Testing mixed signal SOCs

被引：1

作者：

Burns, M ^{[1
]}

机构：

[1] Texas Instruments Inc, Dallas, TX 75265 USA

来源：

关键词：

D O I：

10.1109/TEST.1998.743322

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：1132 / 1132

页数：1

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