A statistical model for path delay faults in VLSI circuits

被引：1

作者：

Hamad, M ^{[1
]}

Landis, D ^{[1
]}

机构：

[1] UNIV S FLORIDA,COLL ENGN,TAMPA,FL 33620

来源：

PROCEEDINGS OF THE IEEE SOUTHEASTCON '96: BRINGING TOGETHER EDUCATION, SCIENCE AND TECHNOLOGY | 1996年

关键词：

D O I：

10.1109/SECON.1996.510096

中图分类号：

TP31 [计算机软件];

学科分类号：

081202 ; 0835 ;

摘要：

引用

页码：388 / 392

页数：3

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