Investigation of Application-Specific Bias Conditions and Dose Rate Dependency in Total Ionizing Dose (TID) Response

被引：0
|
作者：
Bozovich, Amanda N. [1 ,2 ]
Duc Nguyen [2 ]
Rax, Bernard G. [2 ]
Davila, Joe [2 ]
Zajac, Stephanie A. [2 ]
机构：
[1] CALTECH, Jet Prop Lab, NASA, 4800 Oak Grove Dr, Pasadena, CA 91109 USA
[2] CALTECH, Jet Prop Lab, 4800 Oak Grove Dr, Pasadena, CA 91109 USA
来源：
2020 IEEE RADIATION EFFECTS DATA WORKSHOP (IN CONJUNCTION WITH 2020 NSREC) | 2020年
关键词：
D O I：
10.1109/REDW51883.2020.9325830
中图分类号：
O35 [流体力学]; O53 [等离子体物理学];
学科分类号：
070204 ; 080103 ; 080704 ;
摘要：
This paper investigates flight circuit application bias and irradiation dose rate dependencies ("test as you fly" conditions) in the total ionizing dose (TID) response of various electronic components considered for use in a space radiation environment.
引用
收藏
页码：13 / 18
页数：6
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