Single Event Upset Characterization of the Kintex-7 Field Programmable Gate Array Using Proton Irradiation

被引：0
|
作者：
Hiemstra, David M. [1 ]
Kirischian, Valeri [1 ]
机构：
[1] MDA, Brampton, ON L6S 4J3, Canada
来源：
2014 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW) | 2014年
关键词：
single event upset; SRAM FPGA; proton irradiation; Kintex-7;
D O I：
暂无
中图分类号：
TL [原子能技术]; O571 [原子核物理学];
学科分类号：
0827 ; 082701 ;
摘要：
Proton induced SEU cross-sections of the SRAM which stores the logic configuration and certain functional blocks of the Kintex-7 FPGA are presented. Upset rates in the space radiation environment are estimated.
引用
收藏
页数：4
相关论文
共 50 条
  • [11] Single Event Upset Characterization of a Mixed-Signal Field Programmable Gate Array Using Proton Irradiation
    Hiemstra, David M.
    Gill, Prab
    2011 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2011, : 88 - 91
  • [12] Part II: Dynamic single event upset characterization of the Virtex-II field programmable gate array using proton irradiation
    Hiemstra, DM
    Chayab, F
    NSREC: 2005 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD, 2005, : 46 - 50
  • [13] Single-Event Characterization of the 20 nm Xilinx Kintex UltraScale Field-Programmable Gate Array under Heavy Ion Irradiation
    Lee, David S.
    Allen, Gregory R.
    Swift, Gary
    Cannon, Matthew
    Wirthlin, Michael
    George, Jeffrey S.
    Koga, Rokutaro
    Huey, Kangsen
    2015 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2015, : 222 - 227
  • [14] Dynamic single event upset characterization of the Virtex-II and Spartan-3 SRAM field programmable gate arrays using proton irradiation
    Hiemstra, DM
    Chayab, F
    Szajek, L
    2004 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD, 2004, : 79 - 84
  • [15] Proton-induced single-event effects on 28 nm Kintex-7 FPGA
    Wang, Zibo
    Chen, Wei
    Yao, Zhibin
    Zhang, Fengqi
    Luo, Yinhong
    Tang, Xiaobin
    Guo, Xiaoqiang
    Ding, Lili
    Peng, Cong
    MICROELECTRONICS RELIABILITY, 2020, 107 (107)
  • [16] Single event upset and hardening in 0.15 μm antifuse-based field programmable gate array
    Wang, JJ
    Wong, W
    Wolday, S
    Cronquist, B
    McCollum, J
    Katz, R
    Kleyner, I
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2003, 50 (06) : 2158 - 2166
  • [17] SEU Characterization of the Microsemi PolarFire Field Programmable Gate Array Functional Blocks using Proton Irradiation
    Waskowic, Jacob
    Hiemstra, David M.
    Shi, Shuting
    Chen, Li
    2021 IEEE NUCLEAR AND SPACE RADIATION EFFECTS CONFERENCE (NSREC) / 2021 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2021, : 53 - 56
  • [18] SEL and SEFI discrimination in Kintex-7 using focused laser irradiation
    Pechenkin, Alexander A.
    Novikov, Alexander A.
    Novikova, Marina M.
    Bobrovsky, Dmitriy, V
    Sorokoumov, George S.
    2018 18TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS), 2018, : 295 - 297
  • [19] Single event upset characterization of the Pentium® MMX and Celeron® microprocessors using proton irradiation
    Hiemstra, DM
    Baril, A
    2000 IEEE RADIATION EFFECTS DATA WORKSHOP - WORKSHOP RECORD, 2000, : 39 - 44
  • [20] Single Event Upset Characterization of the Zynq UltraScale plus MPSoC Using Proton Irradiation
    Hiemstra, David M.
    Kirischian, Valeri
    Brelski, Jakub
    2017 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2017, : 135 - 138
12345