Single Event Upset Characterization of the Zynq UltraScale plus MPSoC Using Proton Irradiation

被引：0
|
作者：
Hiemstra, David M. [1 ]
Kirischian, Valeri [1 ]
Brelski, Jakub [1 ]
机构：
[1] MDA, Brampton, ON L6S 4J3, Canada
来源：
2017 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW) | 2017年
关键词：
single event upset; SRAM FPGA; proton irradiation; Zynq UltraScale; MPSoC;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Proton induced SEU cross-sections of the SRAM which stores the logic configuration and certain functional blocks of the Zynq UltraScale+ MPSOC are presented. Upset rates in the space radiation environment are estimated.
引用
收藏
页码：135 / 138
页数：4
相关论文
共 50 条
  • [1] Mitigating single event upset method for Zynq MPSoC
    Cui, Xiuhai
    Liu, Liansheng
    Liang, Jun
    Peng, Yu
    MICROELECTRONICS RELIABILITY, 2019, 100
  • [2] Single Event Upset Characterization of the Kintex UltraScale Field Programmable Gate Array Using Proton Irradiation
    Hiemstra, David M.
    Kirischian, Valeri
    Brelski, Jakub
    2016 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2016, : 170 - 174
  • [3] Neutron, 64 MeV proton & alpha single-event characterization of Xilinx 16nm FinFET Zynq® UltraScale plus ™ MPSoC
    Maillard, Pierre
    Hart, Michael
    Barton, Jeff
    Arver, Jue
    Smith, Christina
    2017 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2017, : 139 - 143
  • [4] Part II: Single Event Upset Characterization of the Kintex UltraScale Field Programmable Gate Array Using Proton Irradiation
    Hiemstra, David M.
    Kirischian, Valeri
    2018 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2018, : 185 - 188
  • [5] Programmable HSA Accelerators for Zynq UltraScale plus MPSoC Systems
    Bauer, Wolfgang
    Holzinger, Philipp
    Reichenbach, Marc
    Vaas, Steffen
    Hartke, Paul
    Fey, Dietmar
    EURO-PAR 2018: PARALLEL PROCESSING WORKSHOPS, 2019, 11339 : 733 - 744
  • [6] Single Event Upset Characterization of the Zynq-7000 ARM® Cortex™-A9 Processor Unit Using Proton Irradiation
    Hiemstra, David M.
    Kirischian, Valeri
    2015 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW), 2015, : 76 - 78
  • [7] Connectivity verification of Zynq UltraScale plus MPSoC With TTC and WDT Interrupts
    Rajani, A.
    Vijitha, P.
    2017 INTERNATIONAL CONFERENCE OF ELECTRONICS, COMMUNICATION AND AEROSPACE TECHNOLOGY (ICECA), VOL 2, 2017, : 444 - 448
  • [8] Vulnerability evaluation on 16 nm FinFET Ultrascale plus MPSoC using fault injection and proton irradiation
    Li, Yonghong
    Yang, Weitao
    Wang, Maocheng
    Li, Yang
    Guo, Yaxin
    Li, Pei
    Zhao, Haoyu
    He, Chaohui
    Wang, Di
    Yang, Ye
    Zhang, Xiaodong
    An, Heng
    MICROELECTRONICS RELIABILITY, 2022, 133
  • [9] Implementation of Coprocessor for Integer Multiple Precision Arithmetic on Zynq Ultrascale plus MPSoC
    Stefanski, Tomasz P.
    Rudnicki, Kamil
    Zebrowski, Wojciech
    PROCEEDINGS OF THE 28TH INTERNATIONAL CONFERENCE MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS (MIXDES 2021), 2021, : 280 - 285
  • [10] Single event upset characterization of the Pentium® MMX and Celeron® microprocessors using proton irradiation
    Hiemstra, DM
    Baril, A
    2000 IEEE RADIATION EFFECTS DATA WORKSHOP - WORKSHOP RECORD, 2000, : 39 - 44
12345