The role of microanalysis in the characterization of interfaces

被引：0
|
作者：
Rühle, M [1 ]
Elsässer, C [1 ]
Scheu, C [1 ]
Sigle, W [1 ]
机构：
[1] Max Planck Inst Met Forsch, D-70174 Stuttgart, Germany
来源：
MICROBEAM ANALYSIS 2000, PROCEEDINGS | 2000年 / 165期
关键词：
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：1 / 2
页数：2
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