The role of microanalysis in the characterization of interfaces

被引：0

作者：

Rühle, M ^{[1
]}

Elsässer, C ^{[1
]}

Scheu, C ^{[1
]}

Sigle, W ^{[1
]}

机构：

[1] Max Planck Inst Met Forsch, D-70174 Stuttgart, Germany

来源：

MICROBEAM ANALYSIS 2000, PROCEEDINGS | 2000年 / 165期

关键词：

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1 / 2

页数：2

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