Thin gate, dielectric TFTs using damascene-gate structures

被引:0
|
作者
Ma, E [1 ]
Wagner, S [1 ]
机构
[1] Princeton Univ, Dept Elect Engn, Princeton, NJ 08544 USA
关键词
D O I
暂无
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
As flat panel display sizes and resolutions increase, it becomes necessary to improve the electronic performance of the TFT array. This requires the use of low-resistance gate lines and faster switching TFTs, which can be achieved by using thick gate metal and thin gate dielectrics, respectively. However, in conventional inverted-staggered devices, thick gates create a large step which then requires a thick gate dielectric for adequate coverage. The approach presented here embeds the gate in a passivation layer so that thin gate dielectrics can be deposited on a relatively flat surface. More importantly, this structure is achieved without increasing the number of masks used in conventional processes and does not require any chemical-mechanical polishing of the surface. Profilometry reveals a smooth surface with step mismatch as low as 10 nm. Gate dielectrics as thin as 50 nm were deposited and excellent TFT performance is obtained.
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页码:149 / 162
页数:14
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