共 50 条
- [31] Effect of Top Gate Bias on NBIS in Dual Gate a-IGZO TFTs 2015 22nd International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD), 2015, : 123 - 125
- [35] Ultra-thin gate dielectric reliability projections 2005 INTERNATIONAL CONFERENCE ON INTEGRATED CIRCUIT DESIGN AND TECHNOLOGY, 2005, : 129 - 133
- [37] Highly reliable thin hafnium oxide gate dielectric STRUCTURE AND ELECTRONIC PROPERTIES OF ULTRATHIN DIELECTRIC FILMS ON SILICON AND RELATED STRUCTURES, 2000, 592 : 81 - 86
- [39] Performances of Self-Aligned Top-Gate a-IGZO TFTs with Ultrathin PECVD SiO2 Gate Dielectric 2020 IEEE ELECTRON DEVICES TECHNOLOGY AND MANUFACTURING CONFERENCE (EDTM 2020), 2020,