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- [3] Proton implantation induced damage to heavily doped n-GaAs as envisaged by charge deep-level transient spectroscopy PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1997, 162 (02): : 547 - 557
- [5] DEEP-LEVEL TRANSIENT SPECTROSCOPY MEASUREMENTS OF MAJORITY CARRIER TRAPS IN NEUTRON-IRRADIATED N-TYPE SILICON DETECTORS NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1989, 279 (1-2): : 277 - 280
- [6] Deep-level transient spectroscopy measurements of majority carrier traps in neutron-irradiated n-type silicon detectors Borchi, E., 1600, (279): : 1 - 2
- [8] INVESTIGATION OF ANNEALING OF NEUTRON-IRRADIATED N-TYPE SILICON BY THE DEEP LEVEL TRANSIENT SPECTROSCOPY METHOD SOVIET PHYSICS SEMICONDUCTORS-USSR, 1983, 17 (06): : 729 - 730