Wafer-Scale MEMS Technology of New Vertically Laminated Cantilevers

被引:2
|
作者
Zhang, Y. [1 ]
Toda, A. [2 ]
Lu, J. [1 ]
Okada, H. [1 ]
Kobayashi, T. [1 ]
Itoh, T. [1 ]
Maeda, R. [1 ]
机构
[1] Natl Inst Avanced Ind Sci & Technol AIST, Namiki 1-2-1, Tsukuba, Ibaraki 3058564, Japan
[2] Meltex Inc, Saitama 3310811, Japan
来源
EUROSENSORS XXV | 2011年 / 25卷
关键词
MEMS; Cantilevers; Laminated strcture; Electroless nickel;
D O I
10.1016/j.proeng.2011.12.167
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
This paper presents a new wafer-scale micromachining technology of vertically Si/metal laminated cantilever (3D micro cantilever). The 3D cantilever consists of vertically laminated structure so that it works in the in-the-plane mode, which is totally different from those traditional cantilevers of planar laminated configuration. The vertically laminated configuration has the advantage of easy-to-package, non-stiction and compact but it is involved of surface micromachining technology of high topography surface. High resolution patterning technology of thick electroless-plated nickel alloy film was for the first time established on the high topography surface. The minimum feature size of 10 mu m was successfully realized in the 1.5 mu m-thick nickel film with the undercut ratio of about 1. Prototype of the 3D cantilever was successfully fabricated by the new wafer-scale micromachining technology. (C) 2011 Published by Elsevier Ltd.
引用
收藏
页数:4
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