On Built-In Self-Test for Multipliers

被引：3
|
作者：
Pulukuri, Mary D. [1 ]
Starr, George J. [1 ]
Stroud, Charles E. [1 ]
机构：
[1] Auburn Univ, Dept Elect & Comp Engn, Auburn, AL 36849 USA
来源：
IEEE SOUTHEASTCON 2010: ENERGIZING OUR FUTURE | 2010年
关键词：
D O I：
10.1109/SECON.2010.5453929
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
We evaluate some of the previously proposed test algorithms and approaches for various types of multipliers. We present methods to effectively test multipliers independent of their architecture and to achieve greater than 99% single stuck-at gate-level fault coverage with a simple 8-bit or 9-bit binary up-counter and some multiplexers. Finally, we discuss testing the multipliers present in most current Field Programmable Gate Arrays (FGPAs). (1)
引用
收藏
页码：25 / 28
页数：4
相关论文
共 50 条
  • [21] Built-in self-test with an alternating output
    Bogue, T
    Gossel, M
    Jurgensen, H
    Zorian, Y
    DESIGN, AUTOMATION AND TEST IN EUROPE, PROCEEDINGS, 1998, : 180 - 184
  • [22] Built-in self-test of MEMS accelerometers
    Deb, N
    Blanton, RD
    JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2006, 15 (01) : 52 - 68
  • [23] LOCST - A BUILT-IN SELF-TEST TECHNIQUE
    LEBLANC, JJ
    IEEE DESIGN & TEST OF COMPUTERS, 1984, 1 (04): : 45 - 52
  • [24] BUILT-IN SELF-TEST IS HERE TO STAY
    AGARWAL, VK
    EE-EVALUATION ENGINEERING, 1994, 33 (12): : 8 - 8
  • [25] Built-In Self-Test for Multipliers in Altera Cyclone II Field Programmable Gate Arrays
    Lusco, Michael A.
    Dailey, Justin L.
    Stroud, Charles E.
    PROCEEDINGS SSST 2011: 43RD IEEE SOUTHEASTERN SYMPOSIUM ON SYSTEM THEORY, 2011, : 214 - 219
  • [26] Survey on built-in self-test and built-in self-repair of embedded memories
    Jiang, Jian-Hui
    Zhu, Wei-Guo
    Tongji Daxue Xuebao/Journal of Tongji University, 2004, 32 (08): : 1050 - 1056
  • [27] TEST SCHEDULING AND CONTROL FOR VLSI BUILT-IN SELF-TEST
    CRAIG, GL
    KIME, CR
    SALUJA, KK
    IEEE TRANSACTIONS ON COMPUTERS, 1988, 37 (09) : 1099 - 1109
  • [28] REALISTIC BUILT-IN SELF-TEST FOR STATIC RAMS
    DEKKER, R
    BEENKER, F
    THIJSSEN, L
    IEEE DESIGN & TEST OF COMPUTERS, 1989, 6 (01): : 26 - 34
  • [29] Built-in self-test methodology for A/D converters
    deVries, R
    Zwemstra, T
    Bruls, EMJG
    Regtien, PPL
    EUROPEAN DESIGN & TEST CONFERENCE - ED&TC 97, PROCEEDINGS, 1997, : 353 - 358
  • [30] Integration of partial scan and built-in self-test
    AT&T Bell Lab, Princeton, United States
    Journal of Electronic Testing: Theory and Applications (JETTA), 1995, 7 (1-2): : 125 - 137
12345