Design and Fabrication of 3300V/30A 4H-SiC JBS Diode

被引:0
|
作者
Chen Zheng [1 ]
Yang Tongtong [1 ]
Huang Runhua [1 ]
Wang Ling [1 ]
Chen Guran [1 ]
Yang Lijie [1 ]
Bai Song [1 ]
机构
[1] Nanjing Elect Devices Inst, State Key Lab Wide Bandgap Semicond Power Elect D, Nanjing 210016, Jiangsu, Peoples R China
关键词
D O I
暂无
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
The design, fabrication and characterization of a SiC 3300V/30A JBS diode have been presented. The field limiting rings(FLR) termination has been used in the fabrication. Numerical simulations have been performed for the optimal parameters of the FLR technique. A doping of 2.7e15cm(-3) and a thickness of 33 mu m is finally utilized for the drift layer. With 40 rings in the FLR termination, a typical breakdown voltage of 3600V has been achieved. And a forward current of 30A is obtained when the diode is forwardly biased at 2.1V. [GRAPHICS] .
引用
收藏
页码:148 / 151
页数:4
相关论文
共 50 条
  • [41] The successful implementation of a phosphorous-based surface passivation treatment into an industrial 650 V 4H-SiC JBS fabrication process
    Renz, Arne Benjamin
    Baker, Guy William Clarke
    Shah, Vishal Ajit
    Mawby, Philip
    Antoniou, Marina
    Gammon, Peter Michael
    2022 IEEE WORKSHOP ON WIDE BANDGAP POWER DEVICES AND APPLICATIONS IN EUROPE (WIPDA EUROPE), 2022,
  • [42] Heavy Ion Induced Degradation Investigation on 4H-SiC JBS Diode with Different P+ Intervals
    Wu, Zhikang
    Bai, Yun
    Yang, Chengyue
    Li, Chengzhan
    Hao, Jilong
    Tian, Xiaoli
    Wang, Antao
    Tang, Yidan
    Lu, Jiang
    Liu, Xinyu
    ELECTRONICS, 2023, 12 (09)
  • [43] Reliability Aspects of High Voltage 4H-SiC JBS Diodes
    Brosselard, Pierre
    Camara, Nicolas
    Jorda, Xavier
    Vellvehi, Miquel
    Bano, Edwige
    Millan, Jose
    Godignon, Philippe
    SILICON CARBIDE AND RELATED MATERIALS 2007, PTS 1 AND 2, 2009, 600-603 : 935 - +
  • [44] Fabrication and characterization of 4H-SiC pn diode with field limiting ring
    Bahng, W
    Song, GH
    Kim, HW
    Seo, KS
    Kim, NK
    SILICON CARBIDE AND RELATED MATERIALS 2003, PRTS 1 AND 2, 2004, 457-460 : 1013 - 1016
  • [45] Research of Single-Event Burnout in 4H-SiC JBS Diode by Low Carrier Lifetime Control
    Yu, Cheng-Hao
    Wang, Ying
    Li, Xing-Ji
    Liu, Chao-Ming
    Luo, Xin
    Cao, Fei
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2018, 65 (12) : 5434 - 5439
  • [46] A Superior Reverse Characteristics of 1.2 kV 4H-SiC Planar JBS Diode Employing Channeling Implantation
    Kim, Dongyoung
    Sung, Woongje
    IEEE ELECTRON DEVICE LETTERS, 2023, 44 (06) : 979 - 982
  • [47] Area-Efficient, 600V 4H-SiC JBS Diode-Integrated MOSFETs (JBSFETs) for Power Converter Applications
    Yun, Nick
    Lynch, Justin
    Sung, Woongje
    IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS, 2020, 8 (01) : 16 - 23
  • [48] High temperature capability of high voltage 4H-SiC JBS
    Berthou, M.
    Godignon, P.
    Vergne, Bertrand
    Brosselard, Pierre
    HETEROSIC & WASMPE 2011, 2012, 711 : 124 - +
  • [49] Investigation of Avalanche Capability of 1200V 4H-SiC MPS Diodes and JBS Diodes
    Liu, Li
    Ren, Na
    Wu, Jiupeng
    Zhu, Zhengyun
    Xu, Hongyi
    Guo, Qing
    Sheng, Kuang
    PROCEEDINGS OF THE 2020 32ND INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES AND ICS (ISPSD 2020), 2020, : 210 - 213
  • [50] Design and simulation of 4H-SiC low gain avalanche diode
    Yang, Tao
    Fu, Chenxi
    Song, Weimin
    Tan, Yuhang
    Xiao, Suyu
    Wang, Congcong
    Liu, Kai
    Zhang, Xiyuan
    Shi, Xin
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2023, 1056