Measurement of spatial coherence of electron beams by using a small selected-area aperture

被引:11
|
作者
Morishita, Shigeyuki [1 ]
Yamasaki, Jun [2 ]
Tanaka, Nobuo [2 ]
机构
[1] Nagoya Univ, Dept Crystalline Mat Sci, Nagoya, Aichi 4648603, Japan
[2] Nagoya Univ, EcoTopia Sci Inst, Nagoya, Aichi 4648603, Japan
基金
日本学术振兴会;
关键词
Spatial coherence; Transmission electron microscope; Selected-area diffraction; Electron beam; Coherence length; Airy pattern; DIFFRACTION; TRANSPORT;
D O I
10.1016/j.ultramic.2013.02.019
中图分类号
TH742 [显微镜];
学科分类号
摘要
A new method for measuring the spatial coherence of an electron beam in a transmission electron microscope is proposed. In this method, an Airy pattern produced by a circular selected-area (SA) aperture with an effective diameter of several nanometers is analyzed to obtain the degree of coherence as a function of separation in the specimen plane. Using typical TEM illumination conditions, demonstrative measurements were carried out to determine the spatial coherence length, angular size of the electron source and shape of the coherence function. Based on the results, it was shown that the ratio of the spatial coherence length to the beam radius is about 5% for a condenser aperture with a diameter of 100 mu m. This means that perfectly coherent illumination exists within the small SA aperture for beam diameters larger than 560 nm. As an example application of these results, the advantage of SA diffraction over nano-beam diffraction in electron diffractive imaging is discussed. The proposed method is unaffected by temporal coherence or geometric aberrations of the lenses. The possibility of carrying out future measurements using SA apertures with conventional sizes is also discussed. (C) 2013 Elsevier B.V. All rights reserved.
引用
收藏
页码:10 / 17
页数:8
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