Progress in Development of Monolithic Active Pixel Detector for X-ray Astronomy with SOI CMOS Technology

被引:20
|
作者
Nakashima, Shinya [1 ]
Ryu, Syukyo Gando [1 ]
Tsuru, Takeshi Go [1 ]
Takeda, Ayaki
Arai, Yasuo [3 ]
Miyoshi, Toshinobu [2 ,3 ]
Ichimiya, Ryo [3 ]
Ikemoto, Yukiko [3 ]
Imamura, Toshifumi [4 ]
Ohmoto, Takafumi [4 ]
Iwata, Atsushi [4 ]
机构
[1] Kyoto Univ, Dept Phys, Grad Sch Sci, Sakyo Ku, Kitashirakawa Oiwake Cho, Kyoto 6068502, Japan
[2] Grad Univ Adv Studies SOKENDAI, High Energy Accelerator Res Org KEK, Grad Sch High Energy Accelerator Sci, Dept Particle & Nucl Phys, Tsukuba, Ibaraki 3050801, Japan
[3] KEK, High Energy Accelerator Res Org, Inst Particle & Nucl Studies, Tsukuba, Ibaraki 3050801, Japan
[4] A R Tec Corp, Hiroshima 7390046, Japan
关键词
SOI; pixel; X-ray imaging; X-ray spectroscopy; SPECTROMETER;
D O I
10.1016/j.phpro.2012.04.100
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have been developing an active pixel sensor for X-ray astronomy. In this paper, we report on the design and the characterization of the recently-developed device named XRPIX1-FZ. We applied the high-resistivity Si wafer (similar to 7 k Omega cm) to the sensor layer for a thick depletion layer. The chemical-mechanical polishing, which we applied to smooth the rough backside of the Si wafer, successfully reduced the dark current. We used the single-pixel readout mode and achieved the energy resolution of 260 eV in FWHM at 8 keV. Moreover, we developed the 3 x 3 pixel readout mode for the evaluation of split events and confirmed the full depletion of 250 mu m thick at the reverse-bias voltage of 30 V. (C) 2012 Published by Elsevier B.V. Selection and/or peer review under responsibility of the organizing committee for TIPP 11.
引用
收藏
页码:1373 / 1380
页数:8
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