Phase-Noise Measurement System for the Terahertz-Band

被引：1
|
作者：
DeSalvo, J. A. [1 ]
Hati, A. [1 ]
Nelson, C. [1 ]
Howe, D. A. [1 ]
机构：
[1] NIST, Div Time & Frequency, Boulder, CO 80305 USA
来源：
IEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY | 2012年 / 2卷 / 06期
关键词：
Frequency control; harmonic mixers; metrology; phase noise; submillimeter wave measurements; FM NOISE; LINEWIDTH;
D O I：
10.1109/TTHZ.2012.2222295
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We present phase-noise measurements in support of terahertz electronics. By combining even-harmonic mixers with a 2.5 GHz frequency comb, we achieve a phase-noise measurement system in waveguide (WR1.5) by use of cross-spectral and digital phase-noise measurement techniques. At 670 GHz an upper bound of this system's noise floor is found to be -20, -40, and -60 dBc/Hz at 1, 100, and 10000 Hz offsets, respectively. In addition, a commercial, low-phase-noise, 670 GHz source is measured at offset frequencies from 0.1 Hz to 1 MHz.
引用
收藏
页码：638 / 641
页数：4
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