Phase-Noise Measurement System for the Terahertz-Band

被引：1

作者：

DeSalvo, J. A. ^{[1
]}

Hati, A. ^{[1
]}

Nelson, C. ^{[1
]}

Howe, D. A. ^{[1
]}

机构：

[1] NIST, Div Time & Frequency, Boulder, CO 80305 USA

来源：

IEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY | 2012年 / 2卷 / 06期

关键词：

Frequency control; harmonic mixers; metrology; phase noise; submillimeter wave measurements; FM NOISE; LINEWIDTH;

D O I：

10.1109/TTHZ.2012.2222295

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We present phase-noise measurements in support of terahertz electronics. By combining even-harmonic mixers with a 2.5 GHz frequency comb, we achieve a phase-noise measurement system in waveguide (WR1.5) by use of cross-spectral and digital phase-noise measurement techniques. At 670 GHz an upper bound of this system's noise floor is found to be -20, -40, and -60 dBc/Hz at 1, 100, and 10000 Hz offsets, respectively. In addition, a commercial, low-phase-noise, 670 GHz source is measured at offset frequencies from 0.1 Hz to 1 MHz.

引用

页码：638 / 641

页数：4

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