Scan-Controlled Pulse Flip-Flops for Mobile Application Processors

被引:0
|
作者
Kim, Min-su [1 ]
Lee, HyoungWook [1 ]
Park, Jin-Soo [1 ]
Kim, Chung-Hee [1 ]
Kang, Juhyun [1 ]
Shin, Ken [1 ]
Kagramanyan, Emil [1 ]
Jung, Gunok [1 ]
Cho, Ukrae [1 ]
Shin, Youngmin [1 ]
Son, Jae Cheol [1 ]
机构
[1] Samsung Elect, Yongin 449711, Kyunggi Do, South Korea
来源
2013 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS) | 2013年
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Novel high-speed low-power pulse-based flip-flops having a pulse generator controlled by scan input and scan enable signals are presented. The proposed scheme enables the reduction of data-to-output delay by elimination of the MUX-scan logic from the setup time path of flip-flop, at the cost of a small power overhead. The comparison results using the 45 nm CMOS process indicate that the worst-case DQ delay of the proposed flip-flop is reduced by up to 59% while the energy-delay product is improved by up to 80% compared to the conventional master-slave flip-flop. The silicon results show that the new flip-flops function properly down to 0.62 V.
引用
收藏
页码:769 / 772
页数:4
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