In-plane organization of silicon nanocrystals embedded in SiO2 thin films

被引:12
|
作者
Castro, C. [1 ,2 ]
Schamm-Chardon, S. [1 ,2 ]
Pecassou, B. [1 ,2 ]
Andreozzi, A. [3 ]
Seguini, G. [3 ]
Perego, M. [3 ]
BenAssayag, G. [1 ,2 ]
机构
[1] CEMES, CNRS UPR 8011, nMat Grp, F-31055 Toulouse, France
[2] Univ Toulouse, F-31055 Toulouse, France
[3] IMM CNR, Lab MDM, I-20864 Agrate Brianza, MB, Italy
关键词
NONVOLATILE MEMORY APPLICATIONS; ENERGY ION-IMPLANTATION; SEMICONDUCTOR STRUCTURE; BEAM-SYNTHESIS; DEVICES; LAYERS; OXIDE; NANOELECTRONICS; NANOSTRUCTURES; LITHOGRAPHY;
D O I
10.1088/0957-4484/24/7/075302
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Nanofabrication of buried structures with dimensions below 5 nm and with controlled 3D-positioning at the nanoscale was attempted to open new routes to future nanodevices where single nanostructures could be systematically interfaced. A typical example is ultralow-energy ion beam synthesis where already the depth positioning of embedded arrays of silicon nanocrystals can be finely controlled with nanometric precision. In this study, we investigated for the first time the control of the in-plane organization of the nanocrystals using a legitimate patterning option for microelectronic industries, self-assembled block-copolymer. The compatibility with the ultralow-energy ion beam synthesis process of polymeric nanoporous films used as mask was demonstrated together with the capability to control in 3D the organization of Si nanocrystals. The resulting nano-organization consists in a hexagonal array of 20 nm wide nanovolumes containing on average 8 nanocrystals embedded at a controlled depth within a silica matrix.
引用
收藏
页数:6
相关论文
共 50 条
  • [31] Photoluminescence from Si nanocrystals embedded in In2O3/SiO2 glass thin films
    Matsumoto, Kimihisa
    Fujii, Minoru
    Hayashi, Shinji
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2007, 46 (4A): : 1779 - 1782
  • [32] Silicon nanoparticles embedded in SiO2 films with visible photoluminescence
    Makimura, T
    Kunii, Y
    Ono, N
    Murakami, K
    APPLIED SURFACE SCIENCE, 1998, 127 : 388 - 392
  • [33] Effect of nitrogen doping on the structure of cluster or microcrystalline silicon embedded in thin SiO2 films
    Department of Electronic Materials, School of Science and Engineering, Ishinomaki Senshu University, Minamisakai, Ishinomaki 986-8580, Japan
    Thin Solid Films, 1 (275-279):
  • [34] The effect of nitrogen doping on the structure of cluster or microcrystalline silicon embedded in thin SiO2 films
    Ehara, T
    Machida, S
    THIN SOLID FILMS, 1999, 346 (1-2) : 275 - 279
  • [35] Measurement of the in-plane Thermal Conductivity of SiO2 Thin Films due to Surface Phonon-Polaritons
    Tranchant, Laurent
    Ordonez-Miranda, Jose
    Matsumoto, Taihei
    Gluchko, Sergei
    Antoni, Thomas
    Volz, Sebastian
    Miyazaki, Koji
    2015 21ST INTERNATIONAL WORKSHOP ON THERMAL INVESTIGATIONS OF ICS AND SYSTEMS (THERMINIC), 2015,
  • [36] Electroluminescence microscopy and spectroscopy of silicon nanocrystals in thin SiO2 layers
    Valenta, J
    Lalic, N
    Linnros, J
    OPTICAL MATERIALS, 2001, 17 (1-2) : 45 - 50
  • [37] Doping efficiency of phosphorus doped silicon nanocrystals embedded in a SiO2 matrix
    Gutsch, S.
    Hartel, A. M.
    Hiller, D.
    Zakharov, N.
    Werner, P.
    Zacharias, M.
    APPLIED PHYSICS LETTERS, 2012, 100 (23)
  • [38] Second-harmonic generation from silicon nanocrystals embedded in SiO2
    Jiang, Y
    Wilson, PT
    Downer, MC
    White, CW
    Withrow, SP
    APPLIED PHYSICS LETTERS, 2001, 78 (06) : 766 - 768
  • [39] Investigation of electrical and optical measurements of silicon nanocrystals embedded in SiO2 matrix
    R. Karmouch
    G. Savard
    D. Barba
    D. Koshel
    F. Martin
    G. G. Ross
    Journal of Materials Science: Materials in Electronics, 2013, 24 : 1837 - 1841
  • [40] Temperature-dependent Photoluminescence of Silicon Nanocrystals Embedded in SiO2 Matrix
    Zhang Tianning
    Zhang Kenan
    Chen Xiren
    Wang Shuxia
    Zhang Rongjun
    Shao Jun
    Chen Xin
    Dai Ning
    CHEMICAL RESEARCH IN CHINESE UNIVERSITIES, 2018, 34 (04) : 513 - 516