In-plane organization of silicon nanocrystals embedded in SiO2 thin films

被引:12
|
作者
Castro, C. [1 ,2 ]
Schamm-Chardon, S. [1 ,2 ]
Pecassou, B. [1 ,2 ]
Andreozzi, A. [3 ]
Seguini, G. [3 ]
Perego, M. [3 ]
BenAssayag, G. [1 ,2 ]
机构
[1] CEMES, CNRS UPR 8011, nMat Grp, F-31055 Toulouse, France
[2] Univ Toulouse, F-31055 Toulouse, France
[3] IMM CNR, Lab MDM, I-20864 Agrate Brianza, MB, Italy
关键词
NONVOLATILE MEMORY APPLICATIONS; ENERGY ION-IMPLANTATION; SEMICONDUCTOR STRUCTURE; BEAM-SYNTHESIS; DEVICES; LAYERS; OXIDE; NANOELECTRONICS; NANOSTRUCTURES; LITHOGRAPHY;
D O I
10.1088/0957-4484/24/7/075302
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Nanofabrication of buried structures with dimensions below 5 nm and with controlled 3D-positioning at the nanoscale was attempted to open new routes to future nanodevices where single nanostructures could be systematically interfaced. A typical example is ultralow-energy ion beam synthesis where already the depth positioning of embedded arrays of silicon nanocrystals can be finely controlled with nanometric precision. In this study, we investigated for the first time the control of the in-plane organization of the nanocrystals using a legitimate patterning option for microelectronic industries, self-assembled block-copolymer. The compatibility with the ultralow-energy ion beam synthesis process of polymeric nanoporous films used as mask was demonstrated together with the capability to control in 3D the organization of Si nanocrystals. The resulting nano-organization consists in a hexagonal array of 20 nm wide nanovolumes containing on average 8 nanocrystals embedded at a controlled depth within a silica matrix.
引用
收藏
页数:6
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