A 0.02 nJ Self-calibrated 65nm CMOS Delay Line Temperature Sensor

被引:0
|
作者
Xie, Shuang [1 ]
Ng, Wai Tung [1 ]
机构
[1] Univ Toronto, Edward S Rogers Sr Dept Elect & Comp Engn, Toronto, ON M5S 3G4, Canada
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents an area and power efficient delay line based temperature sensor for on-chip monitoring. This sensor can be deployed in large numbers on a microprocessor chip to facilitate advanced thermal and power management techniques. The proposed self-calibration design eliminates the effort associated with two-point calibration commonly found in conventional temperature sensors. In addition, it saves digital decoding power by the use of both tab and counter decoding. Measurement results for a 65nm CMOS design show that the proposed temperature sensor consumes 0.02 nJ energy per conversion. It occupies an active area of 0.002 mm(2) and has a resolution of 0.5 degrees C with errors within +/- 2.0 degrees C over a temperature range from 20 to 80 degrees C.
引用
收藏
页数:4
相关论文
共 50 条
  • [21] A low power, miniature temperature sensor with one-point calibrated accuracy of ±0.25°C from-55 to 125°C in 65nm CMOS process
    Bashir, Mudasir
    Rao, Patri Sreehari
    ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, 2019, 99 (02) : 311 - 323
  • [22] A 0.148nJ/conversion 65nm SOTB Temperature Sensor LSI Using Thermistor-defined current source
    Nii, Shinya
    Ishibashi, Koichiro
    2017 IEEE SOI-3D-SUBTHRESHOLD MICROELECTRONICS TECHNOLOGY UNIFIED CONFERENCE (S3S), 2017,
  • [23] A 0.48V 0.57nJ/Pixel Video-Recording SoC in 65nm CMOS
    Lin, Tay-Jyi
    Chien, Cheng-An
    Chang, Pei-Yao
    Chen, Ching-Wen
    Wang, Po-Hao
    Shyu, Ting-Yu
    Chou, Chien-Yung
    Luo, Shien-Chun
    Guo, Jiun-In
    Chen, Tien-Fu
    Chuang, Gene C. H.
    Chu, Yuan-Hua
    Cheng, Liang-Chia
    Su, Hong-Men
    Jou, Chewnpu
    Ieong, Meikei
    Wu, Cheng-Wen
    Wang, Jinn-Shyan
    2013 IEEE INTERNATIONAL SOLID-STATE CIRCUITS CONFERENCE DIGEST OF TECHNICAL PAPERS (ISSCC), 2013, 56 : 158 - U963
  • [24] DESIGN OF COMPACT CN2 DELAY-BASED PUFS IN 65NM CMOS
    Zhang, Yuejun
    Wang, Pengjun
    Li, Jianrui
    Li, Gang
    2014 12TH IEEE INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT), 2014,
  • [25] A Self-Calibrated Hybrid Thermal-Diffusivity/Resistor-Based Temperature Sensor
    Pan, Sining
    Angevare, Jan A.
    Makinwa, Kofi A. A.
    IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2021, 56 (12) : 3551 - 3559
  • [26] A Low Power High Performance PLL with Temperature Compensated VCO in 65nm CMOS
    Ravinuthula, V.
    Finocchiaro, S.
    2016 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS SYMPOSIUM (RFIC), 2016, : 31 - 34
  • [27] High Efficiency Energy Harvesters in 65nm CMOS Process for Autonomous IoT Sensor Applications
    Taghadosi, Mansour
    Albasha, Lutfi
    Quadir, Nasir A.
    Rahama, Yousuf Abo
    Qaddoumi, Nasser
    IEEE ACCESS, 2018, 6 : 2397 - 2409
  • [28] A 65nm CMOS Self-Terminated Open-Drain IDAC Line Driver Suitable for Fast Ethernet Applications
    Aziz, Joseph
    Wong, Ark-Chew
    Chen, Andrew
    Tam, Derek
    2011 IEEE CUSTOM INTEGRATED CIRCUITS CONFERENCE (CICC), 2011,
  • [29] A universal delay line circuit for variation resilient IC with self-calibrated time-to-digital converter
    Shao, Shuai
    Shi, Youhua
    Dai, Wentao
    Meng, Jianyi
    Shan, Weiwei
    PROCEEDINGS OF THE 2015 IEEE INTERNATIONAL CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS (EDSSC), 2015, : 126 - 129
  • [30] Accurate Power Detector and Dual Directional Coupler with Self-Calibration in 65nm CMOS
    Cohen, Emanuel
    Nazimov, Anna
    Ravid, Shmuel
    2015 10TH EUROPEAN MICROWAVE INTEGRATED CIRCUITS CONFERENCE (EUMIC), 2015, : 124 - 127