A 0.02 nJ Self-calibrated 65nm CMOS Delay Line Temperature Sensor

被引:0
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作者
Xie, Shuang [1 ]
Ng, Wai Tung [1 ]
机构
[1] Univ Toronto, Edward S Rogers Sr Dept Elect & Comp Engn, Toronto, ON M5S 3G4, Canada
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents an area and power efficient delay line based temperature sensor for on-chip monitoring. This sensor can be deployed in large numbers on a microprocessor chip to facilitate advanced thermal and power management techniques. The proposed self-calibration design eliminates the effort associated with two-point calibration commonly found in conventional temperature sensors. In addition, it saves digital decoding power by the use of both tab and counter decoding. Measurement results for a 65nm CMOS design show that the proposed temperature sensor consumes 0.02 nJ energy per conversion. It occupies an active area of 0.002 mm(2) and has a resolution of 0.5 degrees C with errors within +/- 2.0 degrees C over a temperature range from 20 to 80 degrees C.
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页数:4
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