Research and validation of key measurement technologies of large aperture optical elements

被引:0
|
作者
Guo, Renhui [1 ]
Chen, Lei [1 ]
Jiang, Chao [1 ]
Cao, Hui [1 ]
Zhang, Huiqin [1 ]
Zhou, Binbin [1 ]
Song, Le [1 ]
机构
[1] Nanjing Univ Sci & Technol, Nanjing, Peoples R China
关键词
Contrast and validation of software; Absolute plane test; Optical homogeneity; Power spectral density; Stress birefringence;
D O I
10.1117/12.2186267
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A lot of optical components with large aperture are employed in high-power solid-state laser driver. These optical components are with high requirement on the surface shape, optical homogeneity and stress distribution. In order to test these parameters, different types of interferometers, surface profilers and stress meters from different manufacturers are needed. But the problem is the products from different manufacturers may provide different test results. To solve the problem, the research and verification of the key measurement technologies of large aperture optical components are carried out in this paper. The absolute flatness and optical homogeneity measurement methods are analyzed. And the test results of different interferometric software are compared. The test results from different surface profilers and stress meters are also compared. The consistency and reliability of different test software are obtained with the comparing results, which will guide users to select a suitable product.
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页数:11
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