The economics of system-level testing

被引：8
|
作者：
Farren, D [1 ]
Ambler, T [1 ]
机构：
[1] UNIV TEXAS,AUSTIN,TX 78712
来源：
IEEE DESIGN & TEST OF COMPUTERS | 1997年 / 14卷 / 03期
关键词：
D O I：
10.1109/54.605996
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Competitive pressure to streamline system-level test without affecting product quality is mounting. Identifying the features unique to system-level testing, the authors present key results of production testing hosed on a new test cost model.
引用
收藏
页码：51 / 58
页数：8
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