The economics of system-level testing

被引：8
|
作者：
Farren, D [1 ]
Ambler, T [1 ]
机构：
[1] UNIV TEXAS,AUSTIN,TX 78712
来源：
IEEE DESIGN & TEST OF COMPUTERS | 1997年 / 14卷 / 03期
关键词：
D O I：
10.1109/54.605996
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Competitive pressure to streamline system-level test without affecting product quality is mounting. Identifying the features unique to system-level testing, the authors present key results of production testing hosed on a new test cost model.
引用
收藏
页码：51 / 58
页数：8
相关论文
共 50 条
  • [1] System-level testing in operational environments
    Rapport, ID
    Balkcom, GW
    Stirrat, CR
    Wilson, RL
    JOHNS HOPKINS APL TECHNICAL DIGEST, 1996, 17 (04): : 412 - 419
  • [2] Is system-level ESD testing valid for ICs?
    Robinson-Hahn, Donna
    Power Electronics Technology, 2008, 34 (09): : 26 - 29
  • [3] System-level specification testing of wireless transceivers
    Halder, Achintya
    Bhattacharya, Soumendu
    Chatterjee, Abhijit
    IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2008, 16 (03) : 263 - 276
  • [4] A Novel Approach to GPS System-Level Testing
    Weston, Edward
    Schroeder, Glenn A.
    Chadil, Bob
    Herre, Phillip A.
    PROCEEDINGS OF THE 23RD INTERNATIONAL TECHNICAL MEETING OF THE SATELLITE DIVISION OF THE INSTITUTE OF NAVIGATION (ION GNSS 2010), 2010, : 1350 - 1354
  • [5] Conference tackles testing of system-level ICs
    Strassberg, D
    EDN, 1997, 42 (26) : 16 - +
  • [6] System-level testing of the Versatile Link components
    Soos, C.
    Detraz, S.
    Olanterae, L.
    Sigaud, C.
    El Nasr-Storey, S. Seif
    Troska, J.
    Vasey, F.
    JOURNAL OF INSTRUMENTATION, 2013, 8
  • [7] Automated system-level testing of unmanned aerial systems
    Sartaj, Hassan
    Muqeet, Asmar
    Iqbal, Muhammad Zohaib
    Khan, Muhammad Uzair
    AUTOMATED SOFTWARE ENGINEERING, 2024, 31 (02)
  • [8] System-Level Actuator Testing for Mars Rover Application
    Edelson, Kevin
    Benjamin, Brandon
    Dominguez, Luis
    Fuller, Daniel
    Kennett, Andrew
    2018 IEEE AEROSPACE CONFERENCE, 2018,
  • [9] Random testing for system-level functional verification of system-on-chip
    Ma Qinsheng
    Cao Yang
    Yang Jun
    Wang Min
    JOURNAL OF SYSTEMS ENGINEERING AND ELECTRONICS, 2009, 20 (06) : 1378 - 1383
  • [10] Random testing for system-level functional verification of system-on-chip
    Ma Qinsheng 1
    2.State Key Lab.of Software Engineering
    3.Second Dept.
    JournalofSystemsEngineeringandElectronics, 2009, 20 (06) : 1378 - 1383
12345