We made hydrogenated amorphous silicon (a-Si:H) thin film transistor (TFTs) using an ultra violet micro imprint lithography (UV-MIL). UV-MIL a-Si:H TFTs exhibited a field-effect mobility of 1.2 cm(2)/V.s, threshold voltage of 1.9 V and on/off current ratio of 10(8). We investigated threshold voltage shift (Delta nV(th)) of UV-MIL a-Si;H TFTs induced by gate bias stress and bias temperature stress (BTS). We confirmed that UV-MIL a-Si:H TFTs have electrical and thermal stability for application to long term active-matrix liquid-crystal display (AMLCD).