Amorphous silicon thin-film transistors made by microimprint lithography

被引:0
|
作者
Choi, Jung-Su [1 ]
Choo, Byoung-Kwon [1 ]
Song, Na-Young [1 ]
Kim, Se-Hwan [1 ]
Park, Kyu-Chang [1 ]
Jang, Jin [1 ]
机构
[1] Kyung Hee Univ, Adv Display Res Ctr, Seoul 130701, South Korea
关键词
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We made hydrogenated amorphous silicon (a-Si:H) thin film transistor (TFTs) using an ultra violet micro imprint lithography (UV-MIL). UV-MIL a-Si:H TFTs exhibited a field-effect mobility of 1.2 cm(2)/V.s, threshold voltage of 1.9 V and on/off current ratio of 10(8). We investigated threshold voltage shift (Delta nV(th)) of UV-MIL a-Si;H TFTs induced by gate bias stress and bias temperature stress (BTS). We confirmed that UV-MIL a-Si:H TFTs have electrical and thermal stability for application to long term active-matrix liquid-crystal display (AMLCD).
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页码:691 / 694
页数:4
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