High-speed pattern defect detection using laser scattering

被引:0
|
作者
Morrow, W [1 ]
Howland, R [1 ]
Trafas, B [1 ]
机构
[1] TENCOR INSTRUMENTS,MT VIEW,CA 94043
关键词
wafer inspection; laser scattering; contamination; planar defects; imaging methods;
D O I
暂无
中图分类号
TU [建筑科学];
学科分类号
0813 ;
摘要
引用
收藏
页码:232 / 236
页数:5
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