Phase interrogation of a planar integrated refractive index sensor

被引：0
|
作者：
Nemova, Galina [1 ]
Kabashin, Andrei V. [1 ]
Kashyap, Raman [1 ]
机构：
[1] Ecole Polytech, Dept Engn Phys, Montreal, PQ H3C 3A7, Canada
来源：
PHOTONICS NORTH 2008 | 2008年 / 7099卷
关键词：
Refractive index sensor; surface plasmon-polariton; planar structure; Mach-Zehnder interferometer;
D O I：
10.1117/12.806853
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A novel theoretical scheme is presented for a surface plasmon-polariton (SPP) planar refractive index sensor based on one of the simplest integrated optical devices available, the Mach-Zehnder interferometer (MZI), to monitor relative phase variations in waveguides. An SPP is excited with the Bragg grating imprinted into core and buffer layers of one of the arms of the MZI. The main principle of operation of this device is based on the large phase change of the waveguide mode transmitted through the grating during the SPP excitation caused by the change in the refractive index of the sensed layer in contact with the SPP supporting metal layer.
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页数：5
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