A new charge-based continuous model for long-channel Symmetric Double-Gate Junctionless Transistors (SDGJLTM) is proposed and validated with simulations for doping concentrations of 5 x 10(18) and 1 x 10(19) cm(-3), as well as for layer thicknesses of 10, 15 and 20 nm. The model is physically-based, considering both the depletion and accumulation operating conditions. Most model parameters are related to physical magnitudes, and the extraction procedure for each of them is well established. The model provides an accurate description of the transistor behavior in all operating conditions. Among important advantages with respect to previous models are the inclusion of the effect of the series resistance and the fulfilment of the requirement of being symmetrical with respect to V-d = 0 V. (C) 2013 Elsevier Ltd. All rights reserved.
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School of Information Science and Engineering,Shenyang University of TechnologySchool of Information Science and Engineering,Shenyang University of Technology
吴美乐
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靳晓诗
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揣荣岩
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刘溪
JongHo Lee
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School of EECS Eng and ISRC(Inter-University Semiconductor Research Center),Seoul National University Shinlim-Dong Kwanak-Gu,SeoulSchool of Information Science and Engineering,Shenyang University of Technology
机构:
School of Information Science and Engineering,Shenyang University of TechnologySchool of Information Science and Engineering,Shenyang University of Technology
吴美乐
论文数: 引用数:
h-index:
机构:
靳晓诗
论文数: 引用数:
h-index:
机构:
揣荣岩
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h-index:
机构:
刘溪
Jong-Ho Lee
论文数: 0引用数: 0
h-index: 0
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School of EECS Eng and ISRC(Inter-University Semiconductor Research Center),Seoul National University Shinlim-Dong Kwanak-Gu,Seoul 151-742,KoreaSchool of Information Science and Engineering,Shenyang University of Technology