Implementation of CMOS Logic Circuits with Perfect Fault Detection Using Preservative Reversible Gates

被引:0
|
作者
Parvin, Sajjad [1 ]
Altun, Mustafa [1 ]
机构
[1] Istanbul Tech Univ, Dept Elect & Commun Engn, Istanbul, Turkey
关键词
CONCURRENT ERROR-DETECTION;
D O I
10.1109/iolts.2019.8854440
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
In reversible circuits, a fault as a change in logic value at a circuit node always alters an output logic value, so observability of faults at the output is 100%. In other words, reversible circuits are latent-fault-free. Our motivation is to incorporate this unique feature of reversible circuits to design CMOS circuits having perfect or 100% Concurrent Error Detection (CED). For this purpose we propose a new, fault preservative, and reversible gate library called Even Target - Mixed Polarity Multiple Control Toffoli (ET-MPMCT). By using ET-MPCT, we ensure that the parity, even or odd, is preserved at all levels including the output level unless there is a faulty node. Our design strategy has two steps for a reversible function: 1) implement the reversible functions with the ET-MPMCT library; and 2) apply reversible-to-CMOS gate conversion. In case an irreversible function needs to he synthesized then its reversible form is used followed by the two design steps. As a result, we have come up with a CMOS circuit having 100% CED. The performance of our approach is compared with other CED schemes in the literature in terms of area, detection rate, and power consumption. Simulations are done with Cadence Genus tool using TSMC 0.18 mu m technology. Clearly, results are in favor of our proposed technique.
引用
收藏
页码:64 / 67
页数:4
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