Special Section Guest Editorial: Quality Control by Artificial Vision VI

被引：0
|
作者：
Cudel, Christophe [1 ]
Aubreton, Oliver [2 ]
Umeda, Kazunori [3 ]
Kato, Kunihito [4 ]
机构：
[1] Univ Haute Alsace, IRIMAS Res Inst, Mulhouse, France
[2] Univ Bourgogne, ImViA Res Grp, Le Creusot, France
[3] Chuo Univ, Dept Precis Mech, Tokyo, Japan
[4] Gifu Univ, Fac Engn, Gifu, Japan
来源：
JOURNAL OF ELECTRONIC IMAGING | 2020年 / 29卷 / 04期
关键词：
D O I：
10.1117/1.JEI.29.4.041001
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页数：2
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