Special Section Guest Editorial: Quality Control by Artificial Vision VI

被引：0

作者：

Cudel, Christophe ^{[1
]}

Aubreton, Oliver ^{[2
]}

Umeda, Kazunori ^{[3
]}

Kato, Kunihito ^{[4
]}

机构：

[1] Univ Haute Alsace, IRIMAS Res Inst, Mulhouse, France

[2] Univ Bourgogne, ImViA Res Grp, Le Creusot, France

[3] Chuo Univ, Dept Precis Mech, Tokyo, Japan

[4] Gifu Univ, Fac Engn, Gifu, Japan

来源：

JOURNAL OF ELECTRONIC IMAGING | 2020年 / 29卷 / 04期

关键词：

D O I：

10.1117/1.JEI.29.4.041001

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页数：2

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