VLSI IC emission models for system simulation

被引：1

作者：

Steinecke, Thomas ^{[1
]}

Hesidenz, Dirk ^{[1
]}

机构：

[1] Infineon Technol AG, Neubiberg, Germany

来源：

2008 ASIA-PACIFIC SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY AND 19TH INTERNATIONAL ZURICH SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, VOLS 1 AND 2 | 2008年

关键词：

D O I：

10.1109/APEMC.2008.4559802

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The electromagnetic emission of complex very large scale integrated circuits is determined by their operation activity plus the manifold noise propagation paths through the on-chip power routing, the package traces and the planes and traces on the printed circuit board. Good simulation models have to serve two main interests: (1) identification of emission-related IC design weaknesses and estimation of real electromagnetic emission from (1) the IC manufacturer's point of view and (2) the system manufacturer's point of view. This paper presents the general setup for a full system emission simulation and explains the application of this model on a 32-bit automotive microcontroller containing 20 million transistors. Tool-related accuracy limitations of this VLSI emission modeling approach are discussed.

引用

页码：24 / 27

页数：4

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