The complexity analysis of fault simulation algorithm for digital circuits

被引：0

作者：

Gong, YB

机构：

来源：

1996 2ND INTERNATIONAL CONFERENCE ON ASIC, PROCEEDINGS | 1996年

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Based on the experimential results, this paper analyses the computational complexity of every fault simulation algorithm.

引用

页码：372 / 375

页数：4

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