A study on signature analyzer for design for test (DFT)

被引：0

作者：

bin A'ain, A ^{[1
]}

Lim, CT ^{[1
]}

Ng ^{[1
]}

Hong, K ^{[1
]}

Kwang, S ^{[1
]}

Yew, LE ^{[1
]}

机构：

[1] Univ Teknol Malaysia, Fac Elect Engn, Dept Elect, Skudai 81310, Johor, Malaysia

来源：

2004 IEEE INTERNATIONAL CONFERENCE ON SEMICONDUCTOR ELECTRONICS, PROCEEDINGS | 2004年

关键词：

LFSR; PRBS; BIST; ATPG;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper takes a look at the use of linear feedback shift registers (LFSR's) as test pattern generators (TPG's) and signature analyzers for built-in self-test (BIST). We also propose a method to generate pseudorandom test patterns. The proposed method can generate longer sequences of the same set of test patterns.

引用

页码：138 / 142

页数：5

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