A compendium of Single Event Transient data

被引：5
|
作者：
Savage, MW [1 ]
Turflinger, T [1 ]
Howard, JW [1 ]
Buchner, S [1 ]
机构：
[1] NAVSEA Surface Warfare Ctr Div, Crane, IN 47522 USA
来源：
2001 IEEE RADIATION EFFECTS DATA WORKSHOP, WORKSHOP RECORD | 2001年
关键词：
D O I：
10.1109/REDW.2001.960460
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We present a compendium on observed Single Event Transients on analog and digital circuits. Both the data and the test methods used are presented.
引用
收藏
页码：134 / 141
页数：8
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