Selective State Retention Power Gating Based on Gate-Level Analysis

被引:7
|
作者
Greenberg, Shlomo [1 ]
Rabinowicz, Joseph [1 ]
Tsechanski, Ron [1 ]
Paperno, Eugene [1 ]
机构
[1] Ben Gurion Univ Negev, Dept Elect & Comp Engn, Beer Sheva, Israel
关键词
Low power design; power gating; selective state retention power gating; state retention power gating;
D O I
10.1109/TCSI.2013.2286029
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This work presents a novel approach based on gate-level analysis for implementing Selective State Retention Power Gating (SSRPG). A selective SRPG approach mitigates the area and power overhead of the conventional SRPG technique. However, only very few papers suggesting a selective SPRG approach were published. The proposed SSRPG technique employs a formal analysis and, therefore, does not require exhaustive simulations. To implement the new approach, an automatic algorithm, which is performed on a gate-level netlist, has been developed. This algorithm enables the extraction of a subset of flip-flops that is sufficient for a proper state retention power gating. Unique selective SRPG criteria have been defined to support the proposed algorithm. These criteria are used to reduce the total amount of the required retention cells. To the best of our knowledge, this is the first robust SSRPG approach using gate-level analysis for selecting a reduced subset of FFs that require retention. The proposed approach has been applied to a practical design with about 3300 FFs. The experimental results show 78% reduction of the retention SPRG cell area overhead, compared to the common SRPG approach.
引用
收藏
页码:1095 / 1104
页数:10
相关论文
共 50 条
  • [41] A gate-level leakage power reduction method for ultra-low-power CMOS circuits
    Halter, JP
    Najm, FN
    PROCEEDINGS OF THE IEEE 1997 CUSTOM INTEGRATED CIRCUITS CONFERENCE, 1997, : 475 - 478
  • [42] Novel Dynamic State-Deflection Method for Gate-Level Design Obfuscation
    Dofe, Jaya
    Yu, Qiaoyan
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2018, 37 (02) : 273 - 285
  • [43] Hardware Trojan Detection for Gate-Level Netlists Based on Multidimensional Features
    Li, Linyuan
    Xu, Jinfu
    Yan, Yingjian
    Zhao, Conghui
    Liu, Yanjiang
    Computer Engineering and Applications, 2023, 59 (18) : 278 - 284
  • [44] Limits of gate-level power estimation considering real delay effects and glitches
    Meixner, Michael
    Noll, Tobias G.
    2014 INTERNATIONAL SYMPOSIUM ON SYSTEM-ON-CHIP (SOC), 2014,
  • [45] Fast STA Prediction-based Gate-level Timing Simulation
    Ahmad, Tariq B.
    Ciesielski, Maciej J.
    2014 DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION (DATE), 2014,
  • [46] A BACKTRACING-ORIENTED PROCEDURE FOR THE ANALYSIS OF COMBINATIONAL GATE-LEVEL DESIGNS
    SILBERMAN, GM
    SPILLINGER, IY
    INTEGRATION-THE VLSI JOURNAL, 1994, 17 (03) : 271 - 286
  • [47] Hardware Trojans classification based on controllability and observability in gate-level netlist
    Xie, Xin
    Sun, Yangyang
    Chen, Hongda
    Ding, Yong
    IEICE ELECTRONICS EXPRESS, 2017, 14 (18):
  • [48] Gate-Level Masking under a Path-Based Leakage Metric
    Leiserson, Andrew J.
    Marson, Mark E.
    Wachs, Megan A.
    CRYPTOGRAPHIC HARDWARE AND EMBEDDED SYSTEMS - CHES 2014, 2014, 8731 : 580 - 597
  • [49] Hardware Trojan Detection with Linear Regression Based Gate-Level Characterization
    Zhang, Li
    Chang, Chip-Hong
    2014 IEEE ASIA PACIFIC CONFERENCE ON CIRCUITS AND SYSTEMS (APCCAS), 2014, : 256 - 259
  • [50] Hardware Trojans Classification for Gate-level Netlists based on Machine Learning
    Hasegawa, Kento
    Oya, Masaru
    Yanagisawa, Masao
    Togawa, Nozomu
    2016 IEEE 22ND INTERNATIONAL SYMPOSIUM ON ON-LINE TESTING AND ROBUST SYSTEM DESIGN (IOLTS), 2016, : 203 - 206