The design and construction of an ellipsometer based on a fixed-wavelength rotating-retarder Stokes polarimeter is described. Details are provided for an automated calibration scheme that provides two advantages for its operation. The first allows the phase of the lock-in amplifiers to be set based on the raw data, without a known calibration sample. The second illustrates that the relative amplitude of the acquired signals may also be calibrated in a similar manner. As an illustration, the refractive index and thickness of a glass cover slide are determined over a range of incident angles. (C) 2012 Optical Society of America
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Raja Ramanna Centre for Advanced Technology, Advanced Electro-Optics Section, Laser Technology Division, M.P., Indore,452013, IndiaRaja Ramanna Centre for Advanced Technology, Advanced Electro-Optics Section, Laser Technology Division, M.P., Indore,452013, India
Chaturvedi, M.
Bhandare, R.
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Raja Ramanna Centre for Advanced Technology, Advanced Electro-Optics Section, Laser Technology Division, M.P., Indore,452013, IndiaRaja Ramanna Centre for Advanced Technology, Advanced Electro-Optics Section, Laser Technology Division, M.P., Indore,452013, India
Bhandare, R.
Kumar, S.
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Raja Ramanna Centre for Advanced Technology, Advanced Electro-Optics Section, Laser Technology Division, M.P., Indore,452013, IndiaRaja Ramanna Centre for Advanced Technology, Advanced Electro-Optics Section, Laser Technology Division, M.P., Indore,452013, India
Kumar, S.
Verma, Y.
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Raja Ramanna Centre for Advanced Technology, Advanced Electro-Optics Section, Laser Technology Division, M.P., Indore,452013, IndiaRaja Ramanna Centre for Advanced Technology, Advanced Electro-Optics Section, Laser Technology Division, M.P., Indore,452013, India
Verma, Y.
Raja, S.
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Raja Ramanna Centre for Advanced Technology, Advanced Electro-Optics Section, Laser Technology Division, M.P., Indore,452013, IndiaRaja Ramanna Centre for Advanced Technology, Advanced Electro-Optics Section, Laser Technology Division, M.P., Indore,452013, India