X-ray diagnostic calibration with the tabletop laser facility EQUINOX

被引：13

作者：

Reverdin, Charles ^{[1
]}

Paurisse, M. ^{[1
]}

Caillaud, T. ^{[1
]}

Combis, P. ^{[1
]}

Duval, A. ^{[1
]}

Gontier, D. ^{[1
]}

Husson, D. ^{[1
]}

Rubbelynck, C. ^{[1
]}

Zuber, C. ^{[1
]}

机构：

[1] CEA DIF, F-91297 Arpajon, France

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2008年 / 79卷 / 10期

关键词：

calibration; CCD image sensors; X-ray detection; X-ray spectrometers;

D O I：

10.1063/1.2965212

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The broadband x-ray emission of a target irradiated by a laser can be used to check the calibration of detectors. At CEA-DIF we have a tabletop picosecond laser facility called EQUINOX with 0.3 J at 800 nm. The laser is focused inside a target chamber onto a solid target and produces bright radiation in the 100-2000 eV spectral range. The x-ray source is routinely monitored with a pinhole camera for source dimension measurement and with x-ray diodes for flux measurement. In addition an x-ray transmission grating spectrometer, a crystal spectrometer, and a single count charge coupled device camera measure the x-ray spectrum between 100 eV and 15 keV. The absolute calibration of those sets of spectrometers allows us to fully characterize x-ray emission spectra. Typical duration is less than 100 ps. The spectrum can be tuned by changing target material, pulse length, and x-ray filters. An application to checking the calibration of x-ray diodes used in the broad band spectrometer DMX with single shots will be presented.

引用

页数：4

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