Low Temperature Ohmic Contact for p-type GaN using Mg Electrodes

被引：0
|
作者：
Kakushima, K. [1 ]
Ikeuchi, Y. [1 ]
Hoshii, T. [1 ]
Muneta, I. [1 ]
Wakabayashi, H. [1 ]
Tsutsui, K. [2 ]
Iwai, H. [2 ]
Kikuchi, T. [3 ]
Ishikawa, S. [3 ]
机构：
[1] Tokyo Inst Technol, Sch Engn, Midori Ku, 4259 Nagatsuta, Yokohama, Kanagawa 2268502, Japan
[2] Tokyo Inst Technol, Inst Innovat Res, Tokyo, Japan
[3] Toshiba Co Ltd, Corp Mfg Engn Ctr, Tokyo, Japan
来源：
2017 17TH INTERNATIONAL WORKSHOP ON JUNCTION TECHNOLOGY (IWJT) | 2017年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：85 / 86
页数：2
相关论文
共 50 条
  • [41] Microstructural investigation of oxidized Ni/Au ohmic contact to p-type GaN
    Chen, LC
    Chen, FR
    Kai, JJ
    Chang, L
    Ho, JK
    Jong, CS
    Chiu, CC
    Huang, CN
    Chen, CY
    Shih, KK
    JOURNAL OF APPLIED PHYSICS, 1999, 86 (07) : 3826 - 3832
  • [42] Development of Pt-based ohmic contact materials for p-type GaN
    Arai, T
    Sueyoshi, H
    Koide, Y
    Moriyama, M
    Murakami, M
    JOURNAL OF APPLIED PHYSICS, 2001, 89 (05) : 2826 - 2831
  • [43] Microstructural and electrical investigation of Ni/Au ohmic contact on p-type GaN
    Kim, JK
    Je, JH
    Lee, JW
    Park, YJ
    Kim, T
    Jung, IO
    Lee, BT
    Lee, JL
    JOURNAL OF ELECTRONIC MATERIALS, 2001, 30 (02) : L8 - L12
  • [44] Contact mechanisms and design principles for alloyed Ohmic contacts to p-type GaN
    Mohammad, SN
    PHILOSOPHICAL MAGAZINE, 2004, 84 (24): : 2559 - 2578
  • [45] Mechanism for Ohmic contact formation of oxidized Ni/Au on p-type GaN
    Jang, HW
    Kim, SY
    Lee, JL
    JOURNAL OF APPLIED PHYSICS, 2003, 94 (03) : 1748 - 1752
  • [46] Mechanism for Ohmic contact formation of oxidized Ni/Au on p-type GaN
    Jang, H.W. (jllee@postech.ac.kr), 1748, American Institute of Physics Inc. (94):
  • [47] Microstructural and electrical investigation of Ni/Au ohmic contact on p-type GaN
    Jong Kyu Kim
    Jung Ho Je
    Jae Won Lee
    Yong Jo Park
    Taeil Kim
    In-Ok Jung
    Byung-Teak Lee
    Jong-Lam Lee
    Journal of Electronic Materials, 2001, 30 : L8 - L12
  • [48] Microstructural investigation of oxidized Ni/Au ohmic contact to p-type GaN
    Chen, LC
    Chen, FR
    Kai, JJ
    Chang, L
    Ho, JK
    Jong, CS
    Chiu, CC
    Huang, CN
    Chen, CY
    Shih, KK
    MICROSCOPY OF SEMICONDUCTING MATERIALS 1999, PROCEEDINGS, 1999, (164): : 561 - 565
  • [49] High-transparency Ni/Au ohmic contact to p-type GaN
    Sheu, JK
    Su, YK
    Chi, GC
    Koh, PL
    Jou, MJ
    Chang, CM
    Liu, CC
    Hung, WC
    APPLIED PHYSICS LETTERS, 1999, 74 (16) : 2340 - 2342
  • [50] High-transparency Ni/Au Ohmic contact to p-type GaN
    Sheu, JK
    Su, YK
    Chi, GC
    Jou, MJ
    Chang, CM
    Liu, CC
    Hung, WC
    BLUE LASER AND LIGHT EMITTING DIODES II, 1998, : 638 - 641
12345