An efficient compact test generator for I-DDQ testing

被引：5

作者：

Kondo, H ^{[1
]}

Cheng, KT ^{[1
]}

机构：

[1] KAWASAKI STEEL CHEM IND CO LTD,LSI DIV,MIHAMA KU,CHIBA 26101,JAPAN

来源：

关键词：

D O I：

10.1109/ATS.1996.555156

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：177 / 182

页数：6

共 50 条

[21] I-DDQ testing for submicron CMOS IC technology qualification
Soden, JM
IEEE INTERNATIONAL WORKSHOP ON IDDQ TESTING, DIGEST OF PAPERS, 1997, : 52 - 56
[22] High temperature I-DDQ testing for detection of sodium and potassium
Sabin, E
1996 IEEE INTERNATIONAL RELIABILITY PHYSICS PROCEEDINGS, 34TH ANNUAL, 1996, : 355 - 359
[23] Deep sub-micron I-DDQ test options
Sachdev, M
INTERNATIONAL TEST CONFERENCE 1996, PROCEEDINGS, 1996, : 942 - 942
[24] Random testing with partial circuit duplication and monitoring I-DDQ
Yokoyama, H
Wen, XQ
Tamamoto, H
IEEE INTERNATIONAL WORKSHOP ON IDDQ TESTING, DIGEST OF PAPERS, 1997, : 7 - 11
[25] A PRACTICAL METHOD TO INCREASE TEST COVERAGE USING I-DDQ
EHLSCHEID, S
EE-EVALUATION ENGINEERING, 1995, 34 (08): : 94 - &
[26] Using I-DDQ drift testing to detect hydrogen in MOS devices
Sabin, E
Nagalingam, S
Lemke, S
1997 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 35TH ANNUAL, 1997, : 57 - 65
[27] I-DDQ testing experiments for various CMOS logic design structures
Toukmaji, A
Helms, R
Makki, R
Mikhail, W
Toole, P
VLSI DESIGN, 1997, 5 (03) : 253 - 271
[28] OFF-CHIP I-DDQ MONITOR WITH STANDARD TEST INTERFACE
PEDROS, J
RUBIO, A
ELECTRONICS LETTERS, 1995, 31 (14) : 1139 - 1140
[29] Much ado about I-DDQ
Jacob, G
EE-EVALUATION ENGINEERING, 1997, 36 (03): : 126 - +
[30] Deep sub-micron I-DDQ testing: Issues and solutions
Sachdev, M
EUROPEAN DESIGN & TEST CONFERENCE - ED&TC 97, PROCEEDINGS, 1997, : 271 - 278